Bump FPC
Contact can be made with terminals spaced at pitches that pose inspection difficulties for conventional pin probes.
- For various displays connections
- For lighting inspection jigs for LCD panels or organic EL panels, etc.
- For inspection jigs for various circuits
- For inspection jigs for fine circuits in which probe pins cannot be used.
- No damage to test pieces with adoption of Cu + Ni-Au material
- A wide range of forms selectable
- Outstanding reliability with a high enough contact
* Specifications are subject to change without notice for improvement of performance.
For details, contact Taiyo Industrial.