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Bump FPC

 Contact can be made with terminals spaced at pitches that pose inspection difficulties for conventional pin probes.

Bump FPC
  • For various displays connections
  • For lighting inspection jigs for LCD panels or organic EL panels, etc.
  • For inspection jigs for various circuits
  • For inspection jigs for fine circuits in which probe pins cannot be used.
  • No damage to test pieces with adoption of Cu + Ni-Au material
  • A wide range of forms selectable
  • Outstanding reliability with a high enough contact

* Specifications are subject to change without notice for improvement of performance.
For details, contact Taiyo Industrial.